Datenbestand vom 10. Dezember 2024
Verlag Dr. Hut GmbH Sternstr. 18 80538 München Tel: 0175 / 9263392 Mo - Fr, 9 - 12 Uhr
aktualisiert am 10. Dezember 2024
978-3-8439-1437-6, Reihe Elektrotechnik
Benjamin Wittwer Multiharmonisches Source- und Load-Pull Messsystem zur Charakterisierung aktiver Bauelemente mit WCDMA-Signalen
305 Seiten, Dissertation Universität Kassel (2013), Softcover, A5
Continuously growing data rates in modern communication systems for mobile applications offer challenging problems to measurement techniques for device characterisation. In particular, two-tone signals were commonly used to identify power delivered to adjacent channels. However, these signals do not represent the stochastic and continuous frequency-band characteristics of real-world communication signals.
This work focusses on the development of a new, complex and versatile measurement system, in order to close this gap. It allows the characterisation of active microwave devices using single- and two-tone, as well as real world communication signals. Due to an ultra-broadband receiver, the system is not restricted to certain modulation bandwiths dictated by the receiver, allowing the system to cover the whole frequency band of the first three harmonics of a common UMTS-signal with one shot. Moreover, the system is also able to cover even future communication standards because of the ultra-broadband concept. The system can be extended to a multiharmonic source- / load-pull system, using in-house developed multiharmonic sliding-load tuner systems. This allows detailed device characterisation in a non-50 Ohm-environment. By simultaneous tuning of the source and load impedances, the system offers a short way to experimentally defined optimum impedances for the design of active circuits, e. g. amplifiers. The tuner-systems were designed to be very compact, allowing a less space-consuming setup, thus avoiding unnecessary cable connections and increasing the measurement accuracy. The implemented system software allows the rescaling of all power-waves to the device under test. Additionally, algorithms for interpolation and processing of the measured data have been implemented, helping to interpret the measured results.