Datenbestand vom 10. Dezember 2024
Verlag Dr. Hut GmbH Sternstr. 18 80538 München Tel: 0175 / 9263392 Mo - Fr, 9 - 12 Uhr
aktualisiert am 10. Dezember 2024
978-3-8439-1922-7, Reihe Elektrotechnik
Martin Barke Aging Aware Robustness Validation of Digital Integrated Circuits
147 Seiten, Dissertation Technische Universität München (2014), Softcover, A5
The demand on system robustness and its immunity against perturbations are getting increasingly important. Nearly everybody has an intuitive understanding of what robustness means, but there is no proper way how to measure robustness of Integrated Circuits already during the design phase. Therefore, a general robustness model and methods to quantitatively measure robustness are presented. Moreover, these methods are refined to predict the robustness against degradation of digital circuits due to aging effects.